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Technological devices for Ion-plasma processing

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ION-BREEZE

High-frequency single-grid ion source with self-neutralizing ion beam

Ion beam diameter 100 - 400 mm

Ion energy 10 - 250 eV

Ion current density 0.5 - 6 mA/cm2

Designed for use in ion beam-assisted processing, plasma etching, cleaning, plasma-chemical etching, sputtering, and other applications.

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ION-TYPHOON

Gridded RF Ion Sources

Ion beam diameter 100 - 300 mm

Ion energy 150 - 1500 eV

Ion current density up to 4 mA/cm2

Designed for ion beam-assisted processing, sputtering, etching, cleaning, polishing, and other applications.

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E-MONSOON

High-Frequency Electron Source (Beam Neutralizer)

Electrons current up to 1000 mA

Electrons energy 5 - 50 eV

Electron sources are designed for use in ion beam sputtering processes and for neutralizing the positive charge of ion beams.

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PLASMA-CALM

Inductively Coupled Plasma (ICP) Source for Precision Processing

Plasma formation diameter: 150-450 mm

Plasma density (nₑ): up to 10¹³ cm⁻³

Electron temperature: <5 eV

The sources are designed for plasma and plasma-chemical processing.

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MOLLIS-RPS

Inductively Coupled Plasma (ICP) Sources for Remote Plasma Processing

Plasma formation diameter: 60 mm

Plasma density (nₑ): up to 10¹³ cm⁻³

Dissociation degree: >90%

Designed for radical-based processing, etching, deposition, and material removal in microelectronics manufacturing.

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ION-IMBREM

Capacitively Coupled Plasma (CCP) Sources for Direct Plasma Processing

Electrode diameter: 200 mm

Plasma density (nₑ): up to 10¹¹ cm⁻³

Ion energy: 10-800 eV

Designed for plasma processing systems including:

  • Plasma-enhanced chemical vapor deposition (PECVD)

  • Plasma etching (chemical and reactive ion etching modes)

  • Surface cleaning and activation

  • Related plasma-assisted processes

Freegy LLC

UNP: 193098614

Republic of Belarus, Minsk, Nekrasova str., h.39-1, office №438, zip code 220040

e-mail: info@freegy.by; tel. +375 (25) 979 07 31; +375 (44) 798 70 08.

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